| 000 | 01292cam a22003614a 4500 | ||
|---|---|---|---|
| 999 |
_c3935 _d3935 |
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| 001 | 15310581 | ||
| 005 | 20220322103544.0 | ||
| 008 | 080530s2009 nyua b 001 0 eng d | ||
| 010 | _a 2008930122 | ||
| 020 | _a9780387095783 | ||
| 020 | _a0387095780 | ||
| 035 | _a(OCoLC)ocn297525474 | ||
| 040 |
_aYDX _cYDX _dYDXCP _dBWX _dUUM _dOCLCQ _dDEBBG _dDLC |
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| 042 | _alccopycat | ||
| 050 | 0 | 0 |
_aQC482.D5 _bP43 2009 |
| 100 | 1 | _aPecharsky, Vitalij K. | |
| 245 | 1 | 0 |
_aFundamentals of powder diffraction and structural characterization of materials / _cVitalij K. Pecharsky and Peter Y. Zavalij. |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York : _bSpringer, _cc2009. |
||
| 300 |
_axxiii, 741 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aPowders _xOptical properties _xMeasurement. |
|
| 650 | 0 |
_aX-rays _xDiffraction _xMeasurement. |
|
| 650 | 0 | _aX-ray crystallography. | |
| 650 | 0 | 7 |
_aKristallstrukturanalyse. _2swd |
| 650 | 0 | 7 |
_aPulvermethode. _2swd |
| 650 | 0 | 7 |
_aRöntgenstrukturanalyse. _2swd |
| 700 | 1 | _aZavalij, Peter Y. | |
| 856 | 4 | 2 |
_3Full-text here _uhttps://link.springer.com/book/10.1007/978-0-387-09579-0 |
| 906 |
_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg |
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| 942 |
_2lcc _cBK |
||