Fundamentals of powder diffraction and structural characterization of materials / Vitalij K. Pecharsky and Peter Y. Zavalij.
By: Pecharsky, Vitalij K.
Contributor(s): Zavalij, Peter Y.
Publisher: New York : Springer, c2009Edition: 2nd ed.Description: xxiii, 741 p. : ill. ; 24 cm.ISBN: 9780387095783; 0387095780.Subject(s): Powders -- Optical properties -- Measurement | X-rays -- Diffraction -- Measurement | X-ray crystallography | Kristallstrukturanalyse | Pulvermethode | RöntgenstrukturanalyseOnline resources: Full-text here| Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Book | Skoltech library Shelves | QC482.D5 P43 2009 (Browse shelf) | Available | 2000006681 |
Total holds: 0
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| QC476.5 .S73 2003 Transverse patterns in nonlinear optical resonators / | QC476.5 .S73 2003 Transverse patterns in nonlinear optical resonators / | QC476.6 .P44 2012 Luminescence spectroscopy of semiconductors / | QC482.D5 P43 2009 Fundamentals of powder diffraction and structural characterization of materials / | QC610.9 .B1 Физика полупроводников : | QC611 Fundamentals of carrier transport / | QC611 Fundamentals of carrier transport / |
Includes bibliographical references and index.
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